Cables & Accessories

Quietest cables in the Industry. Get the most out of your probe card.


Cables are designed and manufactured by Celadon. Cables are available in lengths custom to the half-meter, and can be manufactured with a variety of industry standard connectors, such as coaxial, triaxial, Type8, Edge 24/48 or 35/70, DSub 9, 15, 25, or 50; or advanced multi-contact. Depending on the overall size of the final product, an anti-abrasion sheath may be used to prevent wire wear.


Light Tight Enclosure

The Celadon Octagon Light Tight Enclosure surrounds the probe card to guarantee maximum low-level current monitoring performance.

  • Removable side panels allow for customization of the cabling connection.
  • 25-pin AMP connectors allow quick connect and disconnect of the low leakage driven guard channels
  • A removable lid completes the light tight design


Modular Adapters

Rigid and stable probe card holder for T200™, T300™, and VersaTile™ with Advanced Cantilever™ technology/VersaPlate™. Also Compatible with T40™, T90™ with Advanced Cantilever™ technology, and special probe cards. Temperature Stable to 400°C. Three point planarity adjustment. Compatible with the Cascade Elite, Accretech UF3000, TEL P12, and other probers. Also designed for high Z force multi-site probing applications.

  • Modular Adaptor Ring
  • High stability
  • Designed for correct probe card heights
  • Allows use of full range of Celadon ceramic probe cards such as T40™, T90™ with Advanced Cantilever™ technology, T200™ and T300™
  • Has insert rings to hold various types of Celadon probe cards, which allows for rapid probe card changes
  • Theta change does not cause x-y shift, reducing setup time via central axis pivot action
  • Transportable from one prober to another with personality rings
  • Allows probe stations to use high pin count probe cards due to superior strength and rigidity (prober requires chuck with minimal tilt for given applied Z force)
  • Designed for thermal probing applications with materials that will hold up to wide temperature variations
  • Has high Z force planarity adjustments required by multi-site probe cards
  • Allows probe cards to be rotated so if wafer orientation changes, you do not have to purchase another probe card

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