T40™

Ultra low noise and fast settling modeling and characterization tests

Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.

The 40 mm tile was designed for mounting on a standard 4.5″ probe card holder. The 1.6 mm (0.062″) thick rails allow the chassis to slip into planarity adjustable probe card holders for most analytical probe stations.

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