VEGA Die Prober

High Performance Laser Dioden Probing Lösungen

VEGA DP80 & DP76

  • A wide range of configuration options perfectly designed for testing VCSELs, EELs and packaged devices.
  • Single die pickup from tape to tape
  • Extremely fast probing and sorting cycle for reduced cost-of-test.
  • Supports a broad range of temperatures ranging from high temperature to sub-zero testing.
  • Multiple test stations for mounting optical components for LIV, Near Field, and Far Field testing.

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Knowledge Base

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