Here you will find examples of applications, reference guides, presentations, and scientific publications of our partners.
This application note describes unique integrated solutions developed by MPI Corporation and Rohde & Schwarz to meet the most challenging wafer-level measurement requirements of today's radio equipment and integrated circuits.
This application note focuses on the unique solutions developed by MPI Corporation to address the challenges of wafer-level calibration and measurements in the THz frequency range.
This Quick Start Guide discusses how to clean, use, and level TITAN™ probe holders to ensure consistent measurement and calibration results over the longest possible period.
This Quick Start Guide is a step-by-step guide for WinCal XE users to successfully calibrate TITAN™ probe holders and the AC-x family of calibration substrates by MPI Corporation.
This Quick Start Guide presents solutions by MPI for accurate CV measurements, calibration of the system regarding probe tips, and a general calibration check.
This scientific article describes challenges in on-wafer calibration in millimeter-wave frequencies, which are the basis for accurate measurements and characterization of active and passive devices.
This article analyzes local S-parameters of multiline TRL and the transfer of TMR calibration procedures for sensitivity to thermal changes in the electrical properties of the calibration standard.
This presentation describes the basics of wafer-level calibration and de-embedding and focuses on their optimal implementation.
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