Measmatic™ is an open, vendor-independent test and measurement software platform for automated characterization, wafer-level testing, and production-oriented measurement workflows.


Benefits and Advantages
- Preconfigured application tests enable a fast start for common measurement tasks without the need to develop standard test routines from scratch.
- Graphical drag-and-drop test sequencer allows users to build structured measurement workflows quickly, with little or no programming experience.
- Loops, branching logic, and parameter lists make it easy to implement complex test sequences in a clear and well-organized structure.
- Vendor-independent instrument integration provides the flexibility to combine measurement instruments, wafer probers, and switching matrices from different manufacturers.
- Python-based test development enables flexible customization and extension of measurement functions, data analysis, and automation logic.
- Custom Python instrument drivers allow seamless integration of new or specialized test equipment without being locked into proprietary vendor ecosystems.
Measmatic brings together test instruments, wafer probers, switching matrices, test sequences, live visualization, and data export in a single, unified software environment. This enables efficient measurement workflows ranging from initial interactive laboratory experiments to fully automated, repeatable production test sequences.
At the core of the platform is a graphical test sequencer that allows users to design and execute measurement workflows visually. Individual tests can be combined, parameterized, executed independently, or linked into complete test sequences with loops, branching logic, and data exchange between test steps. Even complex test flows remain easy to understand, maintain, and operate reliably in both engineering and production environments.
For custom requirements, Measmatic provides a Python-based extension framework. Users can develop their own tests, instrument drivers, user interfaces, analysis functions, and export filters, or customize existing components to meet specific application needs. Integration with Visual Studio Code supports modern development workflows, including debugging and version control. In addition, Measmatic includes preconfigured application tests for common measurement tasks such as power semiconductor characterization, IV/CV and pulsed IV measurements, silicon photonics, and RF and S-parameter applications.
During test execution, Measmatic displays measurement results in real time using configurable tables and charts. Parameters, axes, formulas, limit values, and export formats can be tailored to individual requirements. For wafer-level testing, the platform supports wafer prober integration, wafer maps, die-level binning, automatic site stepping, and temperature control. From interactive laboratory characterization to automated, reproducible production testing, Measmatic provides a scalable, vendor-independent platform without locking users into a proprietary instrument ecosystem.
1. Vendor-Independent Instrument Integration
Combine test and measurement instruments from different manufacturers within a single project. Supports TCP/IP, GPIB, and RS-232 communication, along with native and custom instrument drivers.
2. Graphical Test Design
Create, organize, and execute test sequences visually using a drag-and-drop interface. Support for loops, branching logic, parameter lists, and data exchange between test steps simplifies even complex measurement workflows.
3. Python-Based Extensibility
Develop custom tests, instrument drivers, user interfaces, analysis functions, and export filters. Integrated with Visual Studio Code and the full Python ecosystem for efficient development and maintenance.
4. Preconfigured Application Tests
Get started quickly with ready-to-use test applications for power semiconductor devices, IV/CV and pulsed IV measurements, silicon photonics, and RF and S-parameter characterization.
5. Real-Time Visualization and Data Export
Monitor measurement data live in configurable charts and tables during test execution. Export results to structured formats such as CSV, Excel, PNG, and SVG, or create custom export filters for application-specific requirements.
6. Wafer-Level Testing and Lab-to-Fab Automation
Support for wafer probers, wafer maps, die-level binning, automatic site stepping, and temperature control. Scales seamlessly from engineering characterization in the lab to automated production-oriented test environments.